TRAD : The reference in radiation testing for electronic components.
The cumulative dose (TID, TNID) can degrade the electrical and functional parameters of an electronic component, which can lead to its destruction. The behavior of electronic components against SEE (Single Event Effect) is also very important to predict. Heavy ions or protons can damage the component, as they pass through the device. This mechanism can lead to multiple errors until the destruction of the component. For testing the components, TRAD designs test benches, irradiates the components and measures the different parameters (drifts, occurence rates of SEU, SET, SEL, SEGR, …).